Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Identifieur interne : 000B38 ( Main/Exploration ); précédent : 000B37; suivant : 000B39Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Auteurs : A. D. Yablon [États-Unis]Source :
- Proceedings of SPIE, the International Society for Optical Engineering [ 0277-786X ] ; 2011.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Fabrication industrielle.
English descriptors
- KwdEn :
Abstract
For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.
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Le document en format XML
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